Semiconductor Measurement Application
Semiconductor Measurement Application
VIEW metrology solutions measure critical dimensions in a wide variety of applications involving 2D micro-components and assemblies. Compared to “walk up and measure” routines, VIEW systems are designed for continuous operation in automated production environments, with speeds that often help metrology teams achieve 100% inspection.
Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions.
Measurement of pitch, width, and spacing of flexures, fingers, combs, arcs, circle diameters, and center locations
VIEW system analyzes the pixels within the measurement window and builds a radial intensity profile of the circle
Measuring ball, tooling mark diameters, placement, pad alignment, & wire loop height
Quickly acquire data on connector positions, size, pitch, & coplanarity measurements
Measurement of positioning and rotation (X, Y, and Theta) relative to pads
Accurate and efficient non-contact inspection of fan-out wafer-level packaging with multiple levels of magnification
Measurement of critical features such as the positions of leads, pads, and warpage
Flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions
Metrology system high-resolution stage motion, quality optics, autofocus capabilities
Inspection of electrical test probes requires precision metrology capabilities to accurately measure small features
