PCB Inspection
PCB Inspection
VIEW metrology solutions measure critical dimensions in a wide variety of applications involving 2D micro-components and assemblies. Compared to “walk up and measure” routines, VIEW systems are designed for continuous operation in automated production environments, with speeds that often help metrology teams achieve 100% inspection.
PCB Measurement
Inspection and process control for maintaining quality assurance over PCB artwork and bare-boards represent especially challenging requirements for metrology systems.
Artwork inspection requires precise measurement of critical features such as the positions of leads and pads, while bare-board inspection also involves accurate assessment of hole locations, size, trace widths, board length, width, and warpage. In addition to requiring consistent measurement accuracy over relatively large areas of travel, bare-boards also can pose difficult surface features that necessitate sophisticated lighting capabilities.
Mis-registration of solder paste relative to printed circuit board pads is one of the leading causes of scrap and rework in surface mount technology (SMT) board assembly. In addition, height and volume measurements are crucial to new process development and to the optimization of existing processes.
The epoxy glue dot process used to fix the location of components before the reflow soldering process shares similar requirements. The ability to import CAD file representations of the desired paste and dot locations satisfies a key ease-of-use requirement
Precision stencils for SMT solder paste printing represent a critical linchpin in the achievement of overall productivity and quality manufacturing results within the electronics industry. High-end metrology systems play a vital role in the assurance of the stencil quality needed for producing consistent production results.
Key metrology requirements for stencil process control include the ability to read in various CAD file formats and the programming flexibility to rapidly measure a wide variety of aperture sizes, shapes, and positions, as well as monitoring for clogged/missing apertures.
