Hard Drive Component Metrology
Hard Disc Drive Component Metrology
VIEW metrology solutions measure critical dimensions in a wide variety of applications involving 2D micro-components and assemblies. Compared to “walk up and measure” routines, VIEW systems are designed for continuous operation in automated production environments, with speeds that often help metrology teams achieve 100% inspection.
Hard Disc Drive component measurement
PRECISION ETCH DIMENSION MEASUREMENT OF HARD DISK HEADS
In order to reliably produce hard disk heads with proper performance, a disk head manufacturer must be able to measure the etch dimensions accurately. The required precision can be on the order of a few tenths of a micron or less, requiring nanometer-level detection of the pole tip and the locations of the various edges of the etched steps.
Since the dimensions of the part are so small, and maintaining the surface quality of the head is important, measurements must be performed by an extremely precise non-contact optical coordinate measuring microscope.
Inspection processes for read/write heads require high-precision non-contact metrology functions to control tight Z-axis tolerances in the read/write gap measurements and Z dimension variations from the side rails to the top surface of pole-tip features.
Metrology platforms for head inspection must therefore supplement their X-Y edge-finding capabilities with fast and accurate Z-axis functions, using either highly repeatable video auto-focus or integrated laser options to capture critical 3-dimensional features.
Inspection processes for read/write heads require high-precision non-contact metrology functions to control tight Z-axis tolerances in the read/write gap measurements and Z dimension variations from the side rails to the top surface of pole-tip features.
Metrology platforms for head inspection must therefore supplement their X-Y edge-finding capabilities with fast and accurate Z-axis functions, using either highly repeatable video auto-focus or integrated laser options to capture critical 3-dimensional features.
Slider inspection is a critical data storage manufacturing process that presents difficult challenges from a metrology perspective. Slider inspection requires the acquisition and measurement of relatively small feature sizes with tight tolerances while also demanding short cycle times to provide high throughput for large production volumes.
Partial or missing features can lead to expensive failures and scraping or rework of finished drive assemblies. In addition, the inherently low-contrast backgrounds in some slider inspection operations can require sophisticated lighting and/or through-the-lens laser technologies for consistent high-throughput measurements.
Inspection of data storage flexure suspension assemblies requires extremely accurate and repeatable metrology capabilities, along with special features such as integrated laser auto-focus, versatile lighting, multiple magnifications, and highly programmable functionality.
The accurate measurement of factors such as pitch, roll angles, load beam symmetry/perpendicularity, dimple height/location, flatness, boss diameter, profile, and tab distance also requires the flexibility to inspect parts at various in-process steps as well as at final inspection.
